Tu, K. N. and Gusak, A. M. (2019) A unified model of mean-time-to-failure for electromigration, thermomigration, and stress-migration based on entropy production. Journal of Applied Physics (№ 126). pp. 1-19.
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Abstract
We have revisited Black's equation of mean-time-to-failure (MTTF) for electromigration from the viewpoint that in irreversible processes, entropy production is the controlling behavior. We justify that the power factor on current density is n = 2, as given in the original Black's equation. Furthermore, on the basis of entropy production, we provide a unified model of MTTF for thermomigration and stress-migration. We note that up to now, no MTTF for thermomigration and stress-migration is given.
| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | electromigration ; thermomigration ; stress-migration ; production |
| Subjects: | Фізико-математичні науки |
| Divisions: | Навчально-науковий інститут інформаційних та освітніх технологій |
| Depositing User: | Наукова Бібліотека |
| Date Deposited: | 16 Apr 2020 18:16 |
| Last Modified: | 16 Apr 2020 18:16 |
| URI: | https://eprints.cdu.edu.ua/id/eprint/2078 |
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