Items where Author is "Tuc, K. N."

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Zaporozhets, T. V. and Gusak, A. M. and Tuc, K. N. (2005) Three-dimensional simulation of void migration at the interface between thin metallic film and dielectric under electromigration. American Institute of Physics (№ 98). pp. 1-10.

This list was generated on Mon Jan 30 17:33:42 2023 EET.