A unified model of mean-time-to-failure for electromigration, thermomigration, and stress-migration based on entropy production

Tu, K. N. and Gusak, A. M. (2019) A unified model of mean-time-to-failure for electromigration, thermomigration, and stress-migration based on entropy production. Journal of Applied Physics (№ 126). pp. 1-19.

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Abstract

We have revisited Black's equation of mean-time-to-failure (MTTF) for electromigration from the viewpoint that in irreversible processes, entropy production is the controlling behavior. We justify that the power factor on current density is n = 2, as given in the original Black's equation. Furthermore, on the basis of entropy production, we provide a unified model of MTTF for thermomigration and stress-migration. We note that up to now, no MTTF for thermomigration and stress-migration is given.

Item Type: Article
Uncontrolled Keywords: electromigration ; thermomigration ; stress-migration ; production
Subjects: Фізико-математичні науки
Divisions: Навчально-науковий інститут інформаційних та освітніх технологій
Depositing User: Наукова Бібліотека
Date Deposited: 16 Apr 2020 18:16
Last Modified: 16 Apr 2020 18:16
URI: http://eprints.cdu.edu.ua/id/eprint/2078

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